Force-distance curves by atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Atomic Force Microscopy Application in Biological Research: A Review Study
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
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We have constructed an atomic force microscope enabling one to image the topography of a sample, and to monitor simultaneously ultrasonic surface vibrations in the MHz range. For detection of the distribution of the ultrasonic vibration amplitude, a part of the position-sensing light beam reflected from the cantilever is directed to an external knife-edge detector. Acoustic images taken on the ...
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No other method has opened the door to progress in nanoscience and nanotechnology as much as the introduction of scanning probe methods did in the 1980s, since they offer a way to visualize the nanoworld. For maximum impact, however, the ability to image and manipulate individual atoms is the key. Initially, scanning tunneling microscopy was the only scanningprobe-based method that was able to ...
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A mode of atomic force microscopy AFM is demonstrated where an oscillating AFM cantilever having linear response is driven with two frequencies in the vicinity of a resonance. New frequencies in the response, known as intermodulation products, are generated when the linearity of the cantilever response is perturbed by the nonlinear tip-surface interaction. A rich structure of the intermodulatio...
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ژورنال
عنوان ژورنال: Surface Science Reports
سال: 1999
ISSN: 0167-5729
DOI: 10.1016/s0167-5729(99)00003-5